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Dual-wavelength digital holography: single shot calibration
Luleå University of Technology, Luleå, Sweden.ORCID-id: 0000-0003-2960-3094
Luleå University of Technology, Luleå, Sweden.
Optronic, Skellefteå, Sweden.
Luleå University of Technology, Luleå, Sweden.
2014 (engelsk)Inngår i: Interferometry XVII: Techniques and Analysis / [ed] Katherine Creath, Jan Burke & Joanna Schmit, SPIE - International Society for Optical Engineering, 2014, Vol. 9203, artikkel-id 920305Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

In an on line shape measurement in disturbed environment, use of many wavelengths in order to avoid phase ambiguity may become a problem as it is necessary to acquire all holograms simultaneously due to environmental disturbances. Therefore to make the shape data available the different holograms have to be extracted from a single recorded image in spectral domain. Appropriate cut areas in the Fourier method are therefore of great importance for decoding information carried by different wavelengths. Furthermore using different laser sources, induces aberration and pseudo phase changes which must be compensated. To insure any phase change is only because of the object shape, calibration is therefore indispensable. For this purpose, effects of uncontrolled carrier frequency filtering are discussed. A registration procedure is applied using minimum speckle displacements to find the best cut area to extract and match the interference terms. Both holograms are numerically propagated to a focus plane to avoid any unknown errors. Deviations between a reference known plate and its measurement are found and used for calibration. We demonstrate that phase maps and speckle displacements can be recovered free of chromatic aberrations. To our knowledge, this is the first time that a single shot dual wavelength calibration is reported by defining a criteria to make the spatial filtering automatic avoiding the problems of manual methods. The procedure is shown to give shape accuracy of 35ÎŒm with negligible systematic errors using a synthetic wavelength of 1.1 mm.

sted, utgiver, år, opplag, sider
SPIE - International Society for Optical Engineering, 2014. Vol. 9203, artikkel-id 920305
Serie
Proceedings of SPIE, the International Society for Optical Engineering, ISSN 0277-786X, E-ISSN 1996-756X ; 9203
HSV kategori
Identifikatorer
URN: urn:nbn:se:oru:diva-72596DOI: 10.1117/12.2062101ISI: 000354364200005Scopus ID: 2-s2.0-84922880623OAI: oai:DiVA.org:oru-72596DiVA, id: diva2:1290000
Konferanse
INterferometry XVII: Techniques and Analysis, San Diego, US, August 17-19, 2014
Tilgjengelig fra: 2019-02-19 Laget: 2019-02-19 Sist oppdatert: 2019-03-11bibliografisk kontrollert

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