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Analysis of Key Comparisons with Two Reference Standards: Extended Random Effects Meta-Analysis
Physikalisch-Technische Bundesanstalt, Berlin, Germany; Mälardalen University, Västerås, Sweden.ORCID iD: 0000-0003-1359-3311
Physikalisch-Technische Bundesanstalt, Berlin, Germany.
2018 (English)In: Advanced Mathematical and Computational Tools in Metrology and Testing XI / [ed] A. B. Forbes, N.-F. Zhang, A. Chunovkina, S. Eichstädt, F. Pavese, Singapore: World Scientific, 2018, p. 1-8Chapter in book (Refereed)
Abstract [en]

We propose a statistical method for analyzing key comparisons with two transfer standards measured in two petals. The new approach is based on an extension of the established random effects model. A full Bayesian analysis based on the reference prior is developed and analytic expressions for the results are derived. One benefit of the suggested approach is that it provides a comprehensive assessment of the laboratory biases in terms of their posterior distributions. Another advantage is that it can easily be applied in practice. The approach is illustrated for the CCM.M-K7 key comparison data.

Place, publisher, year, edition, pages
Singapore: World Scientific, 2018. p. 1-8
Keywords [en]
extended random effects model, two transfer standards, reference analysis, CCM.M-K7
National Category
Probability Theory and Statistics Other Physics Topics
Research subject
Mathematics/Applied Mathematics
Identifiers
URN: urn:nbn:se:oru:diva-76696DOI: 10.1142/9789813274303_0001ISBN: 978-981-3274-29-7 (print)ISBN: 978-981-3274-31-0 (electronic)OAI: oai:DiVA.org:oru-76696DiVA, id: diva2:1354050
Available from: 2019-09-24 Created: 2019-09-24 Last updated: 2019-10-03Bibliographically approved

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Bodnar, Olha

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